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Highly sensitive detection of infected red blood cells (IRBCs) with plasmodium falciparum using surface plasmon resonance (SPR) nanostructure

Materials Science
Islamic University of Gaza
Daher, M.G.; Trabelsi, Y.; Prajapati, Y.K.; Panda, A.; Ahmed, N.M.; Zaki Rashed, A.N.Z.
Daher, Malek G. (57298360100); Trabelsi, Youssef (28168082200); Prajapati, Yogendra Kumar (16040280700); Panda, Abinash M. (8415773600); Ahmed, Naser M. (14049849600); Zaki Rashed, Ahmed Nabih (36118361900)
57298360100; 28168082200; 16040280700; 8415773600; 14049849600; 36118361900
2023
Optical and Quantum Electronics
Highly sensitive detection of infected red blood cells (IRBCs) with plasmodium falciparum using surface plasmon resonance (SPR) nanostructure
55
3
Springer
199
Department of Physics, Islamic University of Gaza, Gaza, Palestine; Department of Physics, King Khalid University, Abha, Asir, Saudi Arabia; Photovoltaic and Semiconductor Materials Laboratory, Université de Tunis El Manar, Ecole Nationale d'Ingénieurs de Tunis, Tunis, Tunis, Tunisia; Department of Electronics and Communication Engineering, Motilal Nehru National Institute of Technology Allahabad, Prayagraj, UP, India; Department of Electronics and Communication Engineering, National Institute of Technology Silchar, Silchar, AS, India; School of Physics, Universiti Sains Malaysia, Gelugor, Penang, Malaysia; Faculty of Electronic Engineering, Shibin El Kom, Monufia, Egypt
Daher, Malek G., Department of Physics, Islamic University of Gaza, Gaza, Palestine, School of Physics, Universiti Sains Malaysia, Gelugor, Penang, Malaysia; Trabelsi, Youssef, Department of Physics, King Khalid University, Abha, Asir, Saudi Arabia, Photovoltaic and Semiconductor Materials Laboratory, Université de Tunis El Manar, Ecole Nationale d'Ingénieurs de Tunis, Tunis, Tunis, Tunisia; Prajapati, Yogendra Kumar, Department of Electronics and Communication Engineering, Motilal Nehru National Institute of Technology Allahabad, Prayagraj, UP, India; Panda, Abinash M., Department of Electronics and Communication Engineering, National Institute of Technology Silchar, Silchar, AS, India; Ahmed, Naser M., School of Physics, Universiti Sains Malaysia, Gelugor, Penang, Malaysia; Zaki Rashed, Ahmed Nabih, Faculty of Electronic Engineering, Shibin El Kom, Monufia, Egypt
M.G. Daher; Physics Department, Islamic University of Gaza, Gaza, P.O. Box 108, Palestine; email: malekjbreel20132017@gmail.com
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10.1007/s11082-022-04466-1